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Abstract
In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.
Issue: Vol 2 No 4 (2018)
Page No.: 82-87
Published: Aug 13, 2019
Section: Original Research
DOI: https://doi.org/10.32508/stdjns.v2i4.814
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