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Abstract
In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.
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Article Details
Issue: Vol 2 No 4 (2018)
Page No.: 82-87
Published: Aug 13, 2019
Section: Original Research
DOI: https://doi.org/10.32508/stdjns.v2i4.814
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Copyright: The Authors. This is an open access article distributed under the terms of the Creative Commons Attribution License CC-BY 4.0., which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.
How to Cite
Vo, N., Tran, T., Nguyen, B., Cao, T., & Chau, T. (2019). A new approach to process gamma scattering spectra for aluminum materials. Science & Technology Development Journal: Natural Sciences, 2(4), 82-87. https://doi.org/https://doi.org/10.32508/stdjns.v2i4.814
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