Open Access

Downloads

Download data is not yet available.

Abstract

In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.



Author's Affiliation
Article Details

Issue: Vol 2 No 4 (2018)
Page No.: 82-87
Published: Aug 13, 2019
Section: Original Research
DOI: https://doi.org/10.32508/stdjns.v2i4.814

 Copyright Info

Creative Commons License

Copyright: The Authors. This is an open access article distributed under the terms of the Creative Commons Attribution License CC-BY 4.0., which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

 How to Cite
Vo, N., Tran, T., Nguyen, B., Cao, T., & Chau, T. (2019). A new approach to process gamma scattering spectra for aluminum materials. Science and Technology Development Journal - Natural Sciences, 2(4), 82-87. https://doi.org/https://doi.org/10.32508/stdjns.v2i4.814

 Cited by



Article level Metrics by Paperbuzz/Impactstory
Article level Metrics by Altmetrics

 Article Statistics
HTML = 9 times
Download PDF   = 6 times
Total   = 6 times