Pham A, Hoang D, Nguyen T, Phan T, Tran V. Impacts of the thickness on the electron mobility of gallium and hydrogen co– doped zinc oxide thin films. Science & Technology Development Journal: Natural Sciences [Internet]. 17May2019 [cited 19Apr.2024];2(2):82-7. Available from: http://stdjns.scienceandtechnology.com.vn/index.php/stdjns/article/view/738