Tran, T., Diep, P.-L., Phan, V.-H.-T., Nguyen, T.-L., Le, T.-K., Huynh, Q.-H. and Le, D.-H. (2020) “Automatic chip testing system”, Science & Technology Development Journal: Natural Sciences, 3(3), pp. 235-243. doi: https://doi.org/10.32508/stdjns.v3i3.605.